The SD solution is designed for test, debug, validation, and programming of eMMC, eMCP devices
The SD solution provides a compact test solution for eMMC, eMCP devices used in applications such as handheld, mobile, and TV product development.
- Test, debug, validation, and programming of eMMC, eMCP devices
- Failure analysis / System and wafer test
- Package and Chip qualification
- Production prototype / Data recover
Feature:
- Suitable for devices of Samsung, Hynix, Sandisk, Toshiba, Intel, Kingston etc eMMC and eMCP.
- Support eMMC version: ≤eMMC5.0.
- Support hot plug, eMMC can be directly connected to PC with SD card reader.
- Realize reading, accessing and writting data for eMMC and eMCP devices
Specification:
Mechanical Socket Body: Torlon Socket Lid: Aluminum Alloy Contact: Spring Probe Operation Temperature: -40ºC to 120ºC Life Span at Operating Travel:100K Cycles min. Cycles Spring Force:27gf per Pin | Electrical Current Rating (Continuous) : 2.59A Self Inductance:1.57nH Bandwidth -1dB:10GHz DC Resistance: 42mohm |