IEC61032Test Probe B Jointed finger probe

Product sourcing details

Place of Origin
China
Packaging
1 pcs/box or bulk packing

Supplier: 深圳市创鑫仪器有限公司

Purchasing information

Minimum order
1
Lead time
7 Days

Please confirm with the supplier: Model / reference, Key specifications / compatibility, Samples, Export markets, Supply capacity.

 IEC61032Test Probe B Jointed Finger probe

 key words:Test Probe B, Jointed Probe

 

This jointed test probe B is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

 

Conforms to:

This is the "international" test probe required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.

 

Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.

 

Technical Parameters:

Kunrled finger diameter12mm                                    Knurled Finger length80mmBaffle plate diameter50mmBaffle plate length100mmBaffle thickness20mm
  • Company: 深圳市创鑫仪器有限公司
  • Country: China (Mainland)
  • Business Type: Manufacturer,Trading Company
  • Market: Americas,Africa,Asia,Emerging Markets,Europe,G20,Middle East,Oceania
  • Founded Year: 2013
  • Address: 宝安区西乡大道丰和园1F
  • Contact: Bella Zhou

深圳市创鑫仪器有限公司

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