AOI DCB Automatic Ceramic Substrate Defect Inspection Equipment

Sample Thickness
Inspecting Speed
1930mm (L) ×1430mm (W) × 1900mm (H)
Object Size
Detectable Flaw
short-circuit,connecting line, chipped edge, residual copper,
Suitable Object
1 pcs in 1 carton
90 days
NO Item Parameter
01 Suitable object DCB
02 Object size Max:190×140mm;
03 Sample thickness 1-2mm
04 CCDPixel AOI 1:13um/Pixel

AOI 2/3:24um/Pixel

05 Board warpsolution Auto focus
06 CAM format Gerber
07 Image Processingmethod CCDColor software
08 InspectingSpeed 9.6s/pcs
09 Data source CAM+graphic scanning
10 Auxiliary function Laser marking
11 Defect Confirmation AOIon-line
12 Positioning Way ofceramic substrate Automatic
13 Defectsearching method Image contrast+ logic algorithm
14 Detectable flaw AOI 1:short-circuit,connecting line, chipped edge,residual copper,copper deficiency, copper surface stain, copper surface oxidation,cutting dislocation, ink disconnection, ink shedding, ink contamination,reverseresistance welding mark,resistance weldingdislocation,resistance weldingpinhole., etc .

AOI 2:dint, scratches,wrinkles, bumps;

AOI 3:bubble,indentation;

  • Country: China (Mainland)
  • Business Type: Manufacturer
  • Market:G20,Americas,Europe,Middle East
  • Founded Year:2008
  • Address:NO. 189 , Zhangji Road , Eocnomic Development Zone
  • Contact:Jesse Cheng
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